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Determination of measurement uncertainty of the optical measuring machine using a laser interferometer
Fulová, Silvia ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
This final thesis is dealing with stating uncertainty of optical measuring device Micro-Vu Sol 311, which is located at Faculty of mechanical engineering in Brno. Overview of coordinate measuring machines (CMM for short) and analyzed present status of optical CMM is in summation. This part also includes basic metrology concepts and methodology of determination of uncertainty of measuring instrument. Content of following parts of thesis is detailed description of Micro-Vu SOL 311 machine and etalons that were used in determination of enhanced uncertainty of measurement such as gage blocks, laser interferometer and glass scale. Last part of this thesis includes summary of achieved results and recommendations for practice.
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Development of the Control program for Total station for athletics field Events
Papež, Jakub ; Černý, Martin (referee) ; Kuruc, Michal (advisor)
In this Bachelor’s thesis is created system MERADIS, which controls a total station, measure angles and lengths and processes the measured values. The system is designed for use in measuring performance in athletic field events. In the introductory part of this work are presented athletic field events and their measurement. Next part is devoted analyzes of measurement accuracy and measurement development program. The last part briefly describes the individual components of the system MERADIS.
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Determination Accuracy of Measurement in Nanometrology
Šrámek, Jan ; Číp, Ondřej (referee) ; Tykal, Miroslav (referee) ; Jankových, Róbert (advisor)
The presented doctoral thesis deals with measurements of extremely small sizes in nanometrology using a touch probe, which constitutes a part of a three-coordinate measuring system. It addresses a newly developed method of exact measurements in nanometrology by touch probes. The aim of this work was to expand the measurement options of this device and design a methodology proposal for the measurement of small parts, including the determination of accuracy of measurement of this device when used in nanometrology. The work includes the new methodology for the calculation of uncertainty of measurement, which constitutes a keystone in determining the accuracy of measurement of a accuracy three coordinate measuring system (hereinafter only nano-CMM). The first part of the doctoral thesis analyzes the present situation in the area of evaluation of accuracy of measurement in very accurate length measurements. It defines and describes individual methods implemented in the determination of accuracy of measurement on the instrument nano-CMM. A great emphasis is placed on the methodology of the measurement uncertainty, which draws from the author’s experience as a metrologist working in the laboratories of the Department of Primary nanometrology and technical length, Czech Metrology Institute Brno (hereinafter only CMI Brno). The second part of the doctoral thesis focuses on the determination of accuracy of length measurement in nanometrology, using a large set of measurements that were carried out under the reproducibility and repeatability conditions. There is also described and tested a model procedure utilizing the Monte Carlo method to simulate the measuring system nano-CMM in order to extent the newly created methodology of the measurement of uncertainty using a touch probe on the instrument nano-CMM. A substantial part of this doctoral thesis provides a detailed evaluation of results obtained from experiments that were executed under the repeatability and reproducibility conditions, especially for the purposes of the determination of the uncertainty of measurement. In this doctoral thesis, the uncertainty of measurement is chosen to quantify the accuracy of measurement of the instrument nano-CMM. The final part of this thesis summarizes the knowledge obtained during the scientific research and provides its evaluation. For the methodology used to determine the accuracy of measurement in nanometrology, it also outlines the future development in the area of scientific research, including the practical use in metrological traceability and extremely accurate measurements for customers. Furthermore, it deals with the possible use of other scanning systems compatible with the instrument nano-CMM.
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Proposal of internal methodology for measurement of products and parts on CMM UPMC Zeiss at CMI Brno
Hájková, Alena ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
This diploma thesis deals with the proposal of internal methodology for measurement of products and parts on CMM UPMC Zeiss at CMI Brno. The first part of this work analyzes the current state of knowledge in the field of accurate measurement on coordinate measuring machines (CMM), which includes the definition of basic metrological concepts, methodology for determining and expressing uncertainties of measurement and a general description of CMM. The diploma thesis also contains a detailed description of the UPMC 850 CARAT S-ACC device from the company Zeiss and summarizes the requirements for the testing laboratory in accordance with the standard ČSN EN 17 025: 2018. The next part of the work is focused on defining and determining the measurement uncertainties for this CMM and on developing a testing procedure for measurements on this machine. The final part of this thesis summarizes the achieved results and recommendations for practice.
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Determination of measurement uncertainty of the optical measuring machine using a laser interferometer
Fulová, Silvia ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
This final thesis is dealing with stating uncertainty of optical measuring device Micro-Vu Sol 311, which is located at Faculty of mechanical engineering in Brno. Overview of coordinate measuring machines (CMM for short) and analyzed present status of optical CMM is in summation. This part also includes basic metrology concepts and methodology of determination of uncertainty of measuring instrument. Content of following parts of thesis is detailed description of Micro-Vu SOL 311 machine and etalons that were used in determination of enhanced uncertainty of measurement such as gage blocks, laser interferometer and glass scale. Last part of this thesis includes summary of achieved results and recommendations for practice.
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Proposal of internal methodology for measurement of products and parts on CMM UPMC Zeiss at CMI Brno
Hájková, Alena ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
This diploma thesis deals with the proposal of internal methodology for measurement of products and parts on CMM UPMC Zeiss at CMI Brno. The first part of this work analyzes the current state of knowledge in the field of accurate measurement on coordinate measuring machines (CMM), which includes the definition of basic metrological concepts, methodology for determining and expressing uncertainties of measurement and a general description of CMM. The diploma thesis also contains a detailed description of the UPMC 850 CARAT S-ACC device from the company Zeiss and summarizes the requirements for the testing laboratory in accordance with the standard ČSN EN 17 025: 2018. The next part of the work is focused on defining and determining the measurement uncertainties for this CMM and on developing a testing procedure for measurements on this machine. The final part of this thesis summarizes the achieved results and recommendations for practice.
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Determination Accuracy of Measurement in Nanometrology
Šrámek, Jan ; Číp, Ondřej (referee) ; Tykal, Miroslav (referee) ; Jankových, Róbert (advisor)
The presented doctoral thesis deals with measurements of extremely small sizes in nanometrology using a touch probe, which constitutes a part of a three-coordinate measuring system. It addresses a newly developed method of exact measurements in nanometrology by touch probes. The aim of this work was to expand the measurement options of this device and design a methodology proposal for the measurement of small parts, including the determination of accuracy of measurement of this device when used in nanometrology. The work includes the new methodology for the calculation of uncertainty of measurement, which constitutes a keystone in determining the accuracy of measurement of a accuracy three coordinate measuring system (hereinafter only nano-CMM). The first part of the doctoral thesis analyzes the present situation in the area of evaluation of accuracy of measurement in very accurate length measurements. It defines and describes individual methods implemented in the determination of accuracy of measurement on the instrument nano-CMM. A great emphasis is placed on the methodology of the measurement uncertainty, which draws from the author’s experience as a metrologist working in the laboratories of the Department of Primary nanometrology and technical length, Czech Metrology Institute Brno (hereinafter only CMI Brno). The second part of the doctoral thesis focuses on the determination of accuracy of length measurement in nanometrology, using a large set of measurements that were carried out under the reproducibility and repeatability conditions. There is also described and tested a model procedure utilizing the Monte Carlo method to simulate the measuring system nano-CMM in order to extent the newly created methodology of the measurement of uncertainty using a touch probe on the instrument nano-CMM. A substantial part of this doctoral thesis provides a detailed evaluation of results obtained from experiments that were executed under the repeatability and reproducibility conditions, especially for the purposes of the determination of the uncertainty of measurement. In this doctoral thesis, the uncertainty of measurement is chosen to quantify the accuracy of measurement of the instrument nano-CMM. The final part of this thesis summarizes the knowledge obtained during the scientific research and provides its evaluation. For the methodology used to determine the accuracy of measurement in nanometrology, it also outlines the future development in the area of scientific research, including the practical use in metrological traceability and extremely accurate measurements for customers. Furthermore, it deals with the possible use of other scanning systems compatible with the instrument nano-CMM.
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Optical fiber sensors for measurement strain and vibration
Mikel, Břetislav ; Helán, R. ; Buchta, Zdeněk ; Holík, M. ; Jelínek, Michal ; Číp, Ondřej
We present optical fiber sensors to measurement strain and vibration. The sensors are based on fiber Bragg gratings (FBG). We prepared construction of strain sensors with respect to its implementation on the outer surface of concrete structures and with compensation of potential temperature drifts. These sensors are projected with look forward to maximal elongation and strength which can be applied to the sensor. Each sensor contains two optical fibers with FBGs. One FBG is glued into the sensor in points of fixation which are in the line with mounting holes. This FBG is prestressed to half of measurement range, than the stretching and pressing can be measured simultaneously by one FBG. The second FBG is placed inside the sensor without fixation to measure temperature drifts. The sensor can be used to structure health monitoring.
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Development of the Control program for Total station for athletics field Events
Papež, Jakub ; Černý, Martin (referee) ; Kuruc, Michal (advisor)
In this Bachelor’s thesis is created system MERADIS, which controls a total station, measure angles and lengths and processes the measured values. The system is designed for use in measuring performance in athletic field events. In the introductory part of this work are presented athletic field events and their measurement. Next part is devoted analyzes of measurement accuracy and measurement development program. The last part briefly describes the individual components of the system MERADIS.
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Generation of exact lengths by the use of optical comb
Šmíd, Radek
We present a method genaration of precise length using optical frequency comb stabilized to atomic reference clock. Optical frequency comb are able to tranfer the exact time stability from atomic clock reference to optical path measurement. We used Fabry-Perot cavity with ultra-low expansion material placed into the vacuum chamber. The exact length of Fabry-Perot cavity in vacuum is used as a reference for measurement of refractive index of ambient air.
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